Karen Paklin

Applications Scientist

Karen is an applications scientist based in Waltham, Massachusetts, USA. She has been working with Olympus since 2014 and supports the Olympus X-ray fluorescence and X-ray diffraction product lines to assist with the development of new products. She is dedicated to sustaining and improving XRF and XRD instruments and enjoys working with clients, research & development, and service.

Karen has a Chemical Engineering degree from Worcester Polytechnic Institute in Worcester, Massachusetts.

InSight

Car catalyst recycling
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How Vanta Analyzers Make Car Catalyst Recycling More Efficient

By Karen Paklin - 1 August, 2018


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How To: Add a Coating Model on Your Vanta Analyzer

By Karen Paklin - 23 February, 2018


/en/insights/xrf-coating-method-thickness

Through Thick and Thin: Using XRF to Measure Coating Thickness

By Karen Paklin - 28 July, 2017