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Semiconductor Manufacturing

Inspecting the Appearance of Markings

The legibility of laser markings is important since the automation system sorts and places IC chips as it identifies the markings. Yet, microscope observation of the marking on a black resin package is difficult due to glare caused by the microscope’s illumination.

Our Solution

Our DSX1000 digital microscope acquires clear images of laser markings without glare thanks to its high dynamic range (HDR) function.

DSX series digital microscope

DSX series digital microscope

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Normal

Normal image

with HDR effect

Image captured using HDR

Application Notes

Sectioning Analysis for Ball Grid Array

Sectioning Analysis for Ball Grid Array (BGA) Surface Mounting of Semiconductor Package using the Olympus OLS5000 Laser Confocal Microscope

Using a microscope to inspect the solder wettability of mounting components

Using a Microscope to Inspect the Solder Wettability of Mounting Components