Microscope Solutions for Semiconductor Manufacturing

IC Design

Integrated circuit (IC) chips are inspected at various stages during the design and testing phases, and highly accurate microscopes are critical to this process.

Observing the Surface of IC Chips

Integrated circuit (IC) design companies need to inspect the pattern of designed IC chips. Additionally, IC chip manufacturers must analyze the IC chip design at the trial production step. Since the inspection volume is low, manufacturers can use manual equipment with high accuracy.

Our Solution

Our BX/MX series industrial microscopes feature magnification as high as 1,000X, enabling you to observe IC patterns with lines in the micrometer or sub-micrometer level. Alternatively, our DSX series microscopes offer magnification as high as 7,000X and are easy to operate.

MX series semiconductor microscope

MX series semiconductor microscope

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BX series metallurgical microscope

BX series metallurgical microscope

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DSX series digital microscope

DSX series digital microscope

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Application Notes

App note Detecting Manufacturing Defects

Detecting Manufacturing Defects on Semiconductor Wafers Using a Digital Microscope

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Measuring the Thickness of Photoresist Film

Measuring the Thickness of Photoresist Film

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Inspecting Bonding Wires Using a Digital Microscope

Inspecting Bonding Wires Using a Digital Microscope

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