5G Device Measurement and Inspection Solutions
Precise, Non-Contact Surface Roughness Measurement
Copper Foil for Printed Circuit Boards
* Image of a printed circuit board cross section
Surface Acoustic Wave Device Wafers
Roughness Measurement Challenges
Conventional roughness measurement using a contact stylus can damage the sample’s surface and is not sensitive enough to detect minute roughness changes.
Laser Microscope Roughness Measurement
The OLS5100 3D measuring laser microscope enables highly accurate, non-contact surface roughness measurement of copper foil and wafers. It’s capable of high-resolution surface roughness measurements in very small areas without damaging the sample’s surface.
3D measurement of copper foil
Copper foil for medium and low frequencies
High-frequency (5G) copper foil
High-resolution image of copper foil surface
3D image of copper foil surface
Roughness measurement of the back surface of lithium tantalate wafer after copper roughening
The roughened state can be immediately imaged
Acquire accurate data based on surface roughness